What is ALT?
Research/Service Description:
Researcher assesses device remaining useful life and failure modes through a set(s) of accelerated lifetime test(s) to validate device reliability (and safety), or meet standards, and minimize the availability time to market. This empowers OBM/OEM/ODM/EMS to deliver high-quality, durable product/system for building reliable house brand.
Research/Service Description:
Researcher assesses device remaining useful life and failure modes through a set(s) of accelerated lifetime test(s) to validate device reliability (and safety), or meet standards, and minimize the availability time to market. This empowers OBM/OEM/ODM/EMS to deliver high-quality, durable product/system for building reliable house brand.
Research/Service Outcome:
List of failure mode(s), degradation index and a predictive model of the remaining useful life
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| Data Driven Methodology | Degradation and Remaining Useful Life Modelling | Root Cause Analysis |
| Demo | Tools | Publication | Patent | Poster | Specification |
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| High Temperature Oven | Temperature and Humidity Chamber | Highly Accelerated Stress Test (HAST) Chamber | Thermal Shock Chamber |